Patent · US Active

System and method for monitoring a manufacturing plant

US10962954B2 · kind B2 · utility

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8Claims
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Key dates

Filing dateAug 22, 2017
Grant dateMar 30, 2021
Priority date
Expiry dateAug 25, 2037

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG05B2219/32179
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

A manufacturing process system comprises any number of assembly stations and test stations, a model unit, and any number of final products is provided. Any of a sample test method and the statistical distribution monitoring method performed by the model unit is configured to monitor the model quality after it is deployed and reduce potential unnecessary costs, such as warranty claim costs as a result of sending bad units to the customers, and rework costs as a result of predicting a good part as bad and wasting additional testing efforts on the bad parts. Further, both methods are configured to maximize the probability of detecting hazardous issues, while having control of the false alarm rate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.