Patent · US Active

Attribute diversity for frequent pattern analysis

US10963519B2 · kind B2 · utility

2Cited by
0References
20Claims
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Key dates

Filing dateMar 18, 2019
Grant dateMar 30, 2021
Priority date
Expiry dateNov 6, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06Q30/016
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A data processing server may receive a set of data objects for frequent pattern (FP) analysis. The set of data objects may be analyzed using an attribute diversity technique. For the set of data attributes of the set of data objects, the server may arrange the attributes in one or more dimensions. The server may initialize a set of centroids on data points and identify mean values of nearby data points. Based on an iteration of the mean value calculation, the server may identify a set of attributes corresponding to final mean values as being groups of similarly frequent attributes. These groups of similarly frequent attributes may be analyzed using an FP analysis procedure to identify frequent patterns of data attributes.

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