Patent · US Active

Soller slit, X-ray diffraction apparatus, and method

US10964439B2 · kind B2 · utility

1Cited by
7References
6Claims
0Family size

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Key dates

Filing dateOct 24, 2018
Grant dateMar 30, 2021
Priority date
Expiry dateOct 24, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG21K1/025
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An X-ray diffraction apparatus having a solar slit, and a method for preventing the diffraction image on a detector from spreading in the in-plane direction even when an X-ray irradiation region spreads over the sample surface due to measurement by GIXD, thereby allowing for measurement with a short measurement time and a high resolution. The soller slit 100 includes a plurality of metallic thin plates 110, each being perpendicular to the bottom surface, which are arcuately arranged with a predetermined angular interval between each other so as to pass X-rays in a radiating direction from a particular focus, the soller slit being provided to be used at a position through which X-rays diffracted on a sample surface pass, the particular focus being the center of a goniometer circle, the X-rays being irradiated on a sample at an angle for GIXD.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.