Calibration systems usable for distortion characterization in cameras
US10965935B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 5, 2020 |
| Grant date | Mar 30, 2021 |
| Priority date | — |
| Expiry date | Mar 5, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/55
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Example embodiments relate to calibration systems usable for distortion characterization in cameras. An example embodiment includes a calibration system. The calibration system includes a first calibration target that includes a first mirror, a plurality of fiducials positioned on or adjacent to the first mirror, and an indexing fiducial positioned on or adjacent to the first mirror. The calibration system also includes a second calibration target that includes one or more second mirrors and has an aperture defined therein. The first mirror and the one or more second mirrors are separated by a distance. The first mirror faces the one or more second mirrors. The indexing fiducial is visible through the aperture in the second calibration target. Reflections of the plurality of fiducials are visible through the aperture defined in the second calibration target. The reflections of the plurality of fiducials are iterated reflections.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.