Characterizing a sample by material basis decomposition
US10969220B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 14, 2016 |
| Grant date | Apr 6, 2021 |
| Priority date | — |
| Expiry date | Jun 14, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/50
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for characterizing a sample, by estimating a plurality of characteristic thicknesses, each being associated with a calibration material, including acquiring an energy spectrum (Sech) transmitted through this sample, located in an X and/or gamma spectral band; for each spectrum of a plurality of calibration spectra (sbase(Lk; Lt)) calculating a likelihood from said calibration spectrum (Sbase(Lk; Lt)), and from the spectrum transmitted through the sample (Sech), each calibration spectrum (Sbase(Lk; Lt)) corresponding to the energy spectrum transmitted through a stack of gauge blocks, each formed of a known thickness of a calibration material; estimating the characteristic thicknesses (L1, L2) associated with the sample according to the criterion of maximum likelihood.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.