Semiconductor integrated circuit
US10969426B2 · kind B2 · utility
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15Claims
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Key dates
| Filing date | Jul 30, 2019 |
| Grant date | Apr 6, 2021 |
| Priority date | — |
| Expiry date | Sep 8, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2889
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A semiconductor integrated circuit includes abnormality detectors configured to detect abnormalities in the semiconductor integrated circuit, and a reference voltage output circuit. The reference voltage output circuit includes switches controlled in accordance with detection signals from the abnormality detectors. The reference voltage output circuit is configured to output as an error signal, a reference voltage having one of a plurality of different values depending on conduction states of the switches of the reference voltage output circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.