Charged particle detector
US10969505B2 · kind B2 · utility
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1References
13Claims
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Key dates
| Filing date | Dec 18, 2017 |
| Grant date | Apr 6, 2021 |
| Priority date | — |
| Expiry date | Dec 18, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10F77/953
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
A charged particle detector is provided. The charged particle detector includes a flexible semiconductor wafer, the semiconductor wafer being doped to form a p-n junction, and an amplifier coupled to the semiconductor wafer and configured to amplify a current or voltage across the p-n junction.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.