Reduction of test infrastructure
US10970195B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 13, 2019 |
| Grant date | Apr 6, 2021 |
| Priority date | — |
| Expiry date | Jun 13, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F16/9035
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for reducing test case infrastructure includes generating a first plurality of fingerprints for a first plurality of test cases. Each of the first plurality of fingerprints is associated with one of the first plurality of test cases. Each of the first plurality of fingerprints uniquely identifies a specific code path covered by a corresponding test case. A second plurality of test cases is generated based on a functional coverage model of the SUT. A second plurality of fingerprints is generated for the second plurality of test cases. Each of the second plurality of fingerprints is associated with one of the second plurality of test cases. The first plurality of fingerprints is compared to the second plurality of fingerprints to identify one or more matching fingerprints. One or more test cases is identified within the first plurality of test cases associated with the one or more matching fingerprints.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.