Multiple precision level intersection testing in a ray tracing system
US10970914B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 15, 2019 |
| Grant date | Apr 6, 2021 |
| Priority date | — |
| Expiry date | Nov 15, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2210/12
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A ray-tracing system configured to perform intersection testing, comprising: a tester module for testing rays for intersection with a volume, the tester module being configured to receive a packet of one or more rays to be tested for intersection with the volume, wherein the tester module comprises: a first set of one or more testers configured to perform intersection testing at a first level of precision to provide intersection testing results, wherein for a first type of the intersection testing result from the first set of one or more testers intersection testing does not need to be reperformed at a second level of precision greater than the first level of precision, and for a second type of the intersection testing result from the first set of one or more testers intersection testing is to be reperformed at the second level of precision; and a second set of one or more testers configured to perform intersection testing at the second level of precision; wherein the tester module is configured to: allocate a ray from a received packet to one of the first set of testers for intersection testing at the first level of precision; identify the type of an intersection testing result fo…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.