Reconstruction of surfaces for additive manufacturing
US10974460B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 8, 2020 |
| Grant date | Apr 13, 2021 |
| Priority date | — |
| Expiry date | Jan 8, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/49023
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Tracking of measured depth with intervening depositing of one or more layers provides a way of improving the accuracy of surface reconstruction. For example, knowledge of the desired or expected thickness of each layer, in combination with the scan data is combined to yield higher accuracy than is available from scan data of a single scan alone. One application of such an accurate surface reconstruction is in a feedback arrangement in which the desired thickness of one or more subsequent layers to be deposited after scanning is determined from the estimate of the surface depth and a model of the object that is being fabricated, and by increasing accuracy of the surface depth estimate, the precision of the fabrication of the object may be increased.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.