System and method for monitoring changes in process dynamic behavior by mapping parameters to a lower dimensional space
US10976718B2 · kind B2 · utility
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4References
17Claims
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Key dates
| Filing date | Mar 6, 2019 |
| Grant date | Apr 13, 2021 |
| Priority date | — |
| Expiry date | Apr 9, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/33051
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A method includes acquiring process data collected in an industrial process control and automation system. The method also includes reducing a dimension space of the process data by combining two or more parameters of the process data or examining a frequency response of the process data. The method further includes determining a change in a process based on a change in the process data in the reduced dimension space. The method also includes outputting a result based on the determined change in the process.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.