Patent · US Active

Defect size detection mechanism

US10976974B1 · kind B1 · utility

1Cited by
9References
17Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 23, 2019
Grant dateApr 13, 2021
Priority date
Expiry dateDec 23, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F3/1247
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A system is disclosed. The system includes a print controller including one or more processors to receive print data, rasterize the print data into bitmap data, analyze objects in each page of bitmap data to determine sizes of objects and generate mapping data for each page of bitmap data that maps locations of page bitmap data having same size objects, a print engine to print the bitmap data to a medium and a print verification system to capture one or more images of the medium as print verification data and to detect one or more defects in the print verification data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.