Halo test method for an optical chip in an integrated circuit
US10977469B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 14, 2019 |
| Grant date | Apr 13, 2021 |
| Priority date | — |
| Expiry date | Jun 14, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/311
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention discloses a halo test method for an optical chip in an integrated circuit. A captured image array is processed as a circle by: dividing the array into circular patterns on the basis of the radius, reconstructing the circular patterns into a two-dimensional array according to coordinates, and then performing corresponding operations on the obtained array to obtain a desired value. By the halo test method for an optical chip in an integrated circuit provided in the present invention, without increasing any extra hardware cost and under the primary test conditions, the technical problem in the prior art that there is no well-developed method and algorithm for testing halo on a fingerprint on display (FOD) chip is solved.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.