Methods and devices for reading microarrays
US10977478B2 · kind B2 · utility
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149References
28Claims
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Key dates
| Filing date | Jan 21, 2020 |
| Grant date | Apr 13, 2021 |
| Priority date | — |
| Expiry date | Jan 21, 2040 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49826
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In one embodiment of the invention, a method to image a probe array is described that includes focusing on a plurality of fiducials on a surface of an array. The method utilizes obtaining the best z position of the fiducials and using a surface fitting algorithm to produce a surface fit profile. One or more surface non-flatness parameters can be adjusted to improve the flatness image of the array surface to be imaged.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.