System and method for specular surface inspection
US10977814B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 4, 2019 |
| Grant date | Apr 13, 2021 |
| Priority date | — |
| Expiry date | Jan 4, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30156
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Embodiments described herein relate to systems and methods for specular surface inspection, and particularly to systems and methods for surface inspection comprising inverse synthetic aperture imaging (“ISAI”) and specular surface geometry imaging (“SSGI”). Embodiments may allow an object under inspection, to be observed, imaged and processed while continuing to be in motion. Further, multiple optical input sources may be provided, such that the object does not have to be in full view of all optical sensors at once. Further, multi-stage surface inspection may be provided, wherein an object under inspection may be inspected at multiple stages of an inspection system, such as, for an automotive painting process, inspection at primer, inspection at paint, inspection at final assembly. SSGI imaging modules are also described for carrying out micro-deflectometry.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.