Image sensor with test circuit
US10979701B2 · kind B2 · utility
1Cited by
8References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 2, 2020 |
| Grant date | Apr 13, 2021 |
| Priority date | — |
| Expiry date | Mar 2, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/56
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An image sensor includes a pixel array, an analog-to-digital converter (ADC), and a test circuit. The pixel array includes a plurality of pixels arranged in rows and columns. Each pixel generates an analog signal based on incident light. The ADC converts the analog signal to a digital signal using a counter. The test circuit receives a test code in a test mode, generates a count clock signal based on the test code, tests a counting operation of the counter according to the count clock signal, and externally outputs a test result of the counter through a test terminal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.