Systems and methods to determine formation properties of high-resistivity formations
US10982534B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 7, 2016 |
| Grant date | Apr 20, 2021 |
| Priority date | — |
| Expiry date | Dec 7, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V3/38
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The disclosed embodiments include a method to determine formation properties of a downhole formation and a downhole logging system. In one embodiment, the method includes obtaining a first set of measurements of a formation from a multi-component induction logging tool and performing an inversion process of the first set of measurements to determine a first set of values for one or more formation properties of the formation. The method also includes determining a second set of values for the model parameters based on the measurements of a second logging tool. The method further includes comparing values of the first set of values with corresponding values of the second set of values to determine a data quality of the values of the first set of values and accepting the values of the first set of values if the data quality of the values is above a first threshold.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.