Sample screening method and apparatus, and service object data searching method and apparatus
US10990849B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 13, 2018 |
| Grant date | Apr 27, 2021 |
| Priority date | — |
| Expiry date | Jun 14, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F18/2148
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and an apparatus of screening samples, and a method and an apparatus of searching for service object data are provided. The method of screening samples includes setting up a plurality of screening layers; selecting training samples needed by a current screening layer in the plurality of screening layers; extracting target sample features suitable for the current screening layer from the training samples; determining a screening quantity suitable for the current screening layer using the target sample features; and screening target samples based on the target sample features and the screening quantity. The embodiments of the present disclosure can adaptively adjust respective screening quantities of various screening layers, and can maximally optimize resources, thus balancing effects and performance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.