Device with isolation barrier and fault detection
US10992293B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 20, 2018 |
| Grant date | Apr 27, 2021 |
| Priority date | — |
| Expiry date | Aug 12, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K19/20
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A device that comprises a first semiconductor die and a second semiconductor die. The first semiconductor die comprises a first clock signal generator. The second semiconductor die comprises a fault detection circuit, the fault detection circuit comprising a second clock signal generator, a first counter coupled to the second clock signal generator, multiple storage devices coupled to the second clock signal generator and to the first counter, a logic gate coupled to the multiple storage devices, a second counter coupled to the logic gate and to the first clock signal generator, and a comparator coupled to the logic gate and the second counter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.