Calibration system for concurrent calibration of device sensors
US10992928B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 2, 2020 |
| Grant date | Apr 27, 2021 |
| Priority date | — |
| Expiry date | Jun 2, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30204
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A calibration system includes a grid assembly, a platform, and a controller. The grid assembly includes at least one planar grid. The platform couples to a device under test (DUT) and move the DUT to a plurality of test positions in accordance with a motion sequence. Each test position is reached by a rotation about at most two different axes, and as the DUT moves through the motion sequence, at least one camera on the DUT captures image information describing portions of the grid assembly and an inertial measurement unit (IMU) on the DUT captures IMU information. The controller determines calibration information for the at least one camera on the DUT and for the IMU based in part on a parameterized model of the motion sequence of the DUT, the captured image information, and the captured IMU information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.