Flitch tracking
US10994438B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 27, 2018 |
| Grant date | May 4, 2021 |
| Priority date | — |
| Expiry date | Dec 6, 2038 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P90/80
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
In various embodiments, a scanner optimizer system may generate a virtual model of a predicted flitch based on a 3D model of a log/cant and a cut solution for the log/cant. The scanner optimizer system may compare a virtual model of an actual flitch to virtual models of predicted flitches by comparing data points at a fixed elevation relative to one or both faces of the models. Based on the comparisons, the scanner optimizer system may identify the source log from which the actual flitch was cut. In addition, the scanner optimizer system may identify the saw used to cut the actual flitch, and/or other relevant information, and use the additional information to monitor and adjust the saws and other equipment. Embodiments of corresponding apparatuses and methods are also described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.