Optical scanning for industrial metrology
US10994477B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 1, 2019 |
| Grant date | May 4, 2021 |
| Priority date | — |
| Expiry date | Nov 1, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B26/10
- WIPO fieldOther special machines
- WIPO sectorMechanical engineering
Abstract
An approach to improving optical scanning increases the strength of optical reflection from the build material during fabrication. In some examples, the approach makes use of an additive (or a combination of multiple additives) that increases the received signal strength and/or improves the received signal-to-noise ratio in optical scanning for industrial metrology. Elements not naturally present in the material are introduced in the additives in order to increase fluorescence, scattering or luminescence. Such additives may include one or more of: small molecules, polymers, peptides, proteins, metal or semiconductive nanoparticles, and silicate nanoparticles.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.