Etalon based optical spectrometer
US10996109B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 17, 2019 |
| Grant date | May 4, 2021 |
| Priority date | — |
| Expiry date | Oct 17, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B5/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Conventional etalon based spectrometers have either a limited range of evaluation wavelengths or require continuous scanning of the etalon. Conventional etalon based spectrometers also have limited contrast between the peak transmission of a frequency on resonance and the minimum transmission of a frequency off resonance. An improved optical spectrometer includes a cylindrical lens configured to converge the input beam of light in only one direction, whereby the input beam of light is focused along a focal line. Accordingly, a first etalon receives the input beam of light, and transmits a series of sub-beams, each sub-beam transmitted at a different angle from the normal, and each sub-beam including multiple frequencies based on the FSR, whereby a secondary dispersive element receives each sub-beam, and disperses each sub-beam into individual frequencies. Ideally, a second etalon receives and transmits the sub-beams with increased contrast, and a second thickness of the second etalon is substantially identical to the first thickness of the first etalon.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.