Pattern angle spatial selection structured illumination imaging

US10996453B2 · kind B2 · utility

Assignee

• Illumina, Inc. · US

Inventors

• Peter Clarke Newman · San Diego, US
• Danilo Condello · San Diego, US
• Shaoping Lu · Houston, US
• Simon Prince · Carlsbad, US
• Merek Siu · Alameda, US
• Stanley Hong · Palo Alto, US
• Aaron Liu · Irvine, US

Key dates

• Filing date: Jan 14, 2019
• Grant date: May 4, 2021
• Expiry date: Jan 14, 2039

Classification

• Technology area (CPC G): Physics
• CPC primary: G02B27/58
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The disclosure provides for structured illumination microscopy (SIM) imaging systems. In one set of implementations, a SIM imaging system may be implemented as a multi-arm SIM imaging system, whereby each arm of the system includes a light emitter and a beam splitter (e.g., a transmissive diffraction grating) having a specific, fixed orientation with respect to the system's optical axis. In a second set of implementations, a SIM imaging system may be implemented as a multiple beam splitter slide SIM imaging system, where one linear motion stage is mounted with multiple beam splitters having a corresponding, fixed orientation with respect to the system's optical axis. In a third set of implementations, a SIM imaging system may be implemented as a pattern angle spatial selection SIM imaging system, whereby a fixed two-dimensional diffraction grating is used in combination with a spatial filter wheel to project one-dimensional fringe patterns on a sample.