Patent · US Active

System and method for computing electrical over-stress of devices associated with an electronic design

US10997332B1 · kind B1 · utility

4Cited by
2References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 26, 2019
Grant dateMay 4, 2021
Priority date
Expiry dateSep 26, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2119/02
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Embodiments include herein are directed towards a method for use in an electronic design environment is provided. Embodiments may include receiving, using at least one processor, an electronic design schematic and splitting, using the at least one processor, the electronic design schematic into a plurality of subcircuits. Embodiments may further include independently simulating each of the plurality of subcircuits to generate simulation results and analyzing the simulation results to determine over-stress associated with the plurality of subcircuits.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.