System and method for computing electrical over-stress of devices associated with an electronic design
US10997332B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 26, 2019 |
| Grant date | May 4, 2021 |
| Priority date | — |
| Expiry date | Sep 26, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2119/02
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Embodiments include herein are directed towards a method for use in an electronic design environment is provided. Embodiments may include receiving, using at least one processor, an electronic design schematic and splitting, using the at least one processor, the electronic design schematic into a plurality of subcircuits. Embodiments may further include independently simulating each of the plurality of subcircuits to generate simulation results and analyzing the simulation results to determine over-stress associated with the plurality of subcircuits.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.