Methods and a system for verifying the authenticity of a mark using trimmed sets of metrics
US10997385B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 15, 2019 |
| Grant date | May 4, 2021 |
| Priority date | — |
| Expiry date | Nov 15, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V20/95
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In one implementation, a processor: (1) receives an image of a candidate mark from an image acquisition device, (2) uses the image to measure one or more characteristics at a plurality of locations on the candidate mark, resulting in a first set of metrics, (3) removes, from the first set of metrics, a metric having a dominant amplitude, resulting in a trimmed first set of metrics, (4) retrieves, from a computer-readable memory, a second set of metrics that represents one or more characteristics measured at a plurality of locations on an original mark, (5) removes, from the second set of metrics, a metric corresponding to the metric removed from the first set of metrics, resulting in a trimmed second set of metrics, (6) compares the trimmed first set of metrics with the trimmed second set of metrics, and (7) determines whether the candidate mark is genuine based on the comparison.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.