Feature descriptor matching
US10997746B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 11, 2019 |
| Grant date | May 4, 2021 |
| Priority date | — |
| Expiry date | Jul 10, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V20/56
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Feature descriptor matching described herein may include receiving a first input image and a second input image. A feature detector may detect features from the first and second input images. A descriptor extractor may learn local feature descriptors from the features of the first and second input images based on a feature descriptor matching model trained using a ground truth data set. The descriptor extractor may determine a listwise mean average precision (mAP) rank of a pool of candidate image patches from the second input image with respect to a queried image patch from the first input image based on the feature descriptor matching model, the first set of local feature descriptors, and the second set of local feature descriptors. The descriptor matcher may generate a geometric transformation between the first input image and the second input image based on the listwise mAP and a convolutional neural network.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.