Patent · US Active

Measurement apparatus of vectorial optical fields

US10998981B2 · kind B2 · utility

0Cited by
3References
18Claims
0Family size

Assignee

Inventor

Key dates

Filing dateFeb 28, 2020
Grant dateMay 4, 2021
Priority date—
Expiry dateMay 11, 2040

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04B10/70
  • WIPO fieldTelecommunications
  • WIPO sectorElectrical engineering

Abstract

An apparatus measures the transverse profile of vectorial optical field beams, including at least the directional intensity complex amplitude and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.