Systems and methods for in-silicon measurement of printed circuit board (PCB) trace impedance
US10999922B1 · kind B1 · utility
0Cited by
4References
20Claims
0Family size
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Key dates
| Filing date | Aug 7, 2020 |
| Grant date | May 4, 2021 |
| Priority date | — |
| Expiry date | Aug 7, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05K2201/10212
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods that may be implemented to provide on-board trace impedance testing for a system level board of an information handling system. A printed circuit board (PCB) of the system level board may include built-in test trace circuitry that may be used to measure board trace impedance so that the trace impedance of a fully assembled system level board may be tested and verified for compliance with trace impedance specification, and without requiring any disassembly of the board.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.