X-ray detector for grating-based phase-contrast imaging

US11000249B2 · kind B2 · utility

Assignee

• KONINIKLIJKE PHILIPS N.V. · NL

Inventors

• Heiner Daerr · Hamburg, DE
• Thomas Koehler · Norderstedt, DE

Key dates

• Filing date: Nov 9, 2017
• Grant date: May 11, 2021
• Expiry date: Nov 20, 2037

Classification

• Technology area (CPC G): Physics
• CPC primary: G21K2207/005
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An X-ray detector (10) for a phase contrast imaging system (100) and a phase contrast imaging system (100) with such detector (10) are provided. The X-ray detector (10) comprises a scintillation device (12) and a photodetector (14) with a plurality of photosensitive pixels (15) optically coupled to the scintillation device (12), wherein the X-ray detector (10) comprises a primary axis (16) parallel to a surface normal vector of the scintillation device (12), and wherein the scintillation device (12) comprises a wafer substrate (18) having a plurality of grooves (20), which are spaced apart from each other. Each of the grooves (20) extends to a depth (22) along a first direction (21) from a first side (13) of the scintillation device (12) into the wafer substrate (18), wherein each of the grooves (20) is at least partially filled with a scintillation material. Therein, the first direction (21) of at least a part of the plurality of grooves (20) is different from the primary axis (16), such that at least a part of the plurality grooves (20) is tilted with respect to the primary axis (16). An angle between the first direction (21) of a groove (20) arranged in a center region (24) of t…