Patent · US Active

Testing device

US11002796B2 · kind B2 · utility

1Cited by

5References

20Claims

0Family size

Assignee

Milwaukee Electric Tool Corporation · US

Inventors

Benjamin Oliver Ryan Cabot · Milwaukee, US
Gareth Mueckl · Milwaukee, US

Key dates

Filing date	Jun 28, 2018
Grant date	May 11, 2021
Priority date	—
Expiry date	Nov 17, 2038

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/69
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A testing device including a housing including an indicator, a main housing, and a probe housing, wherein the probe housing is rotatably coupled to the main housing. The testing device further includes a first test probe and a second test probe. The first test probe is coupled to the main housing. The first test probe is configured to be inserted into an alternating-current receptacle. The second test probe is coupled to the probe housing. The second test probe is configured to be inserted into a universal serial bus receptacle.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.