Metrics analysis workflow
US11003682B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 25, 2017 |
| Grant date | May 11, 2021 |
| Priority date | — |
| Expiry date | Jan 5, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L63/20
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Embodiments are disclosed for a visualization system that facilitates exploration and analysis of large sets of data by providing for synchronized, independent visualizations of metrics or event-derived value sets. The visualizations can reflect a variety of data, including pre-prepared metrics, event-derived values, or a combination thereof. Global parameter controls can enable synchronized interaction with multiple visualizations, such as modifying parameters of respective visualizations with a single input. Local parameter controls can enable interaction with an individual visualization, independent of interaction with other visualizations. A variety of tools and interfaces are provided to manipulate the visualizations to facilitate analysis across a variety of metrics within a single interface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.