System and methods for automatic solar panel recognition and defect detection using infrared imaging
US11003940B2 · kind B2 · utility
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13References
15Claims
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Key dates
| Filing date | Jul 17, 2019 |
| Grant date | May 11, 2021 |
| Priority date | — |
| Expiry date | Jul 17, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30108
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Methods and systems are provided for detecting a defect in a solar panel. The method includes initially imaging, via an infrared camera, a group of solar panels. Then, identifying, via a computer system configured for solar panel defect detection, the individual solar panels in the group of solar panels. Finally, identifying, via evaluation of an infrared image obtained by the infrared camera, a defect in at least one of the group of solar panels.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.