Inspection device, image forming apparatus, and inspection method
US11004194B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 16, 2019 |
| Grant date | May 11, 2021 |
| Priority date | — |
| Expiry date | Nov 13, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30144
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An inspection device includes: an image acquirer that acquires an inspection target image; an edge extractor that extracts an edge from each of the inspection target image and a reference image to be used in inspecting the output image; a defect candidate region extractor that extracts a defect candidate region having a possibility of a defect by comparing the inspection target image with the reference image; an edge direction calculator that calculates a direction of the edge in the inspection target image and a direction of the edge in the reference image; and a defect determiner that determines whether the defect candidate region is a defect, on a basis of the direction of the edge in the inspection target image and the direction of the edge in the reference image at a position corresponding to the defect candidate region.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.