Method and test system for performing a run-time measurement
US11005579B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 29, 2020 |
| Grant date | May 11, 2021 |
| Priority date | — |
| Expiry date | Apr 29, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/21
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A test system and method of performing a run-time measurement for calibration of a device used for time-of-flight measurement are disclosed. The method comprises: providing a measurement device, a device under test and a directive component having three ports; connecting the directive component to a transmission port of the measurement device and a reception port of the measurement device; generating a signal by a signal generator; forwarding the signal to the directive component; receiving at least a response by a signal receiver; and determining a loop time indicative of the run-time between the directive component and the device under test as well as a time of internal processing of the device under test, wherein the loop time is independent of a signal processing time of a signal path between the measurement device and the directive component.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.