Method of performing a distance-to-fault measurement as well as measurement instrument
US11005583B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 11, 2020 |
| Grant date | May 11, 2021 |
| Priority date | — |
| Expiry date | Feb 11, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/088
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of performing a distance-to-fault measurement of a signal processing device, comprising: performing a S11 measurement in amplitude and phase with equidistant frequency points assigned to an original frequency space, thereby obtaining original measurement points; calculating a virtual start frequency and a virtual stop frequency based on a start frequency and a stop frequency assigned to the original frequency space; determining virtual equidistant frequency points between the virtual start frequency and the virtual stop frequency; transforming the virtual equidistant frequency points into the original frequency space, thereby obtaining non-equidistant frequency points in the original frequency space; interpolating the original measurement points with respect to the non-equidistant frequency points, thereby obtaining interpolated measurement points; and performing an inverse transformation of the interpolated measurement points. Further, a measurement instrument for performing a distance-to-fault measurement of a signal processing device is described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.