Device and method for testing RF integrated circuit in wireless communication system
US11010572B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 27, 2019 |
| Grant date | May 18, 2021 |
| Priority date | — |
| Expiry date | Dec 27, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06K19/07752
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present disclosure relates to a pre-5th-Generation (5G) or 5G communication system to be provided for supporting higher data rates Beyond 4th-Generation (4G) communication system such as Long Term Evolution (LTE). An electronic device and an operation method thereof are provided for testing performance of a radio frequency integrated circuit (RFIC) in a wireless communication system. The method includes checking a connection state of elements operable as combiners and a plurality of RF chains of the RFIC; performing control to output RF signals from the plurality of RF chains; acquiring an integrated signal by combining the RF signals via the combiners; and determining a quality indicator for the RFIC based the integrated signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.