Jitter determination method and measurement instrument
US11012165B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 23, 2020 |
| Grant date | May 18, 2021 |
| Priority date | — |
| Expiry date | Jan 23, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B14/023
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A jitter determination method for determining at least one jitter component of an input signal is described, wherein the input signal is generated by a signal source, comprising: receiving and/or generating probability data containing information on a collective probability density function of a random jitter component of the input signal and a other bounded uncorrelated jitter component of the input signal; determining a standard deviation of the random jitter component based on the probability data; determining a RJ probability density function associated with the random jitter component based on the standard deviation; and determining a OBUJ probability density function associated with the other bounded uncorrelated jitter component, wherein the OBUJ probability density function is determined based on the probability data and based on the probability density function that is associated with the random jitter component. Further, a measurement instrument is described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.