Fault test circuit using launch-off-shift scan
US11016145B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 19, 2019 |
| Grant date | May 25, 2021 |
| Priority date | — |
| Expiry date | Dec 19, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3187
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated circuit sensor can have a test program generator that is configured to receive a portion of a scan vector, where the scan vector includes a test mode signal and a scan enable signal. The test program generator is configured to retrieve a launch-off-capture test sequence from the scan vector and use the launch-off-capture test sequence and the test mode signal to generate a launch-off-capture test signal. A test signal generator is configured to generate a launch-off-shift test signal using the launch-off-capture test signal and the scan enable signal. A built-in self-test circuit is configured to test the integrated circuit sensor using the launch-off-shift test signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.