Patent · US Active

Scan set pruning for pattern matching queries

US11016975B1 · kind B1 · utility

24Cited by
11References
30Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 30, 2020
Grant dateMay 25, 2021
Priority date
Expiry dateOct 30, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F17/18
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A query directed at a source table organized into a set of batch units is received. The query includes a pattern matching predicate that specifies a search pattern. A set of N-grams are generated based on the search pattern. A pruning index is used to identify a subset of batch units to scan for matching data based on the set of N-grams generated for the search pattern. The pruning index indexes distinct N-grams in the source table. The query is processed by scanning the subset of batch units.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.