Apparatus, method and computer program for analyzing image
US11017255B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 9, 2018 |
| Grant date | May 25, 2021 |
| Priority date | — |
| Expiry date | Jul 18, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/033
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present disclosure relates to an image analysis method, system, and computer program. The image analysis method of the present disclosure includes: receiving a query image; extracting one or more regions of interest from the query image; calculating a first feature for each of the regions of interest by respectively applying the regions of interest to one or more ROI (region of interest) feature extraction models independently learned in order to extract features of the regions of interest; and calculating analysis values of the query image by applying the first features of the regions of interest to a pre-learned integration analysis model. According to the present disclosure, it is possible to reduce the influence on an analysis model by an error that training data created for map learning of an entire image may have, and it is also possible to increase learning accuracy and objectivity of a deep neural network.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.