Measuring device and measuring method for low-attenuation measuring environments
US11019513B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jul 25, 2018 |
| Grant date | May 25, 2021 |
| Priority date | — |
| Expiry date | Dec 12, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04W84/12
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A measuring device for performing measurements on a device under test is provided. It comprises a transmitter, which is adapted to transmit a first message to the device under test with a first transmission power. The first message comprises a first transmission power parameter and an expected reception power parameter. The measuring device moreover comprises a parameter generator, which is adapted to generate the first transmission power parameter larger than the first transmission power by an error value. The parameter generator is moreover adapted to generate the expected reception power parameter lower than an expected reception power of the measuring device, by the error value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.