Method of determining the displacement of a component
US11022568B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 13, 2020 |
| Grant date | Jun 1, 2021 |
| Priority date | — |
| Expiry date | Jan 16, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of determining the displacement of a component within a device during operation of the device, the method comprising the steps of: obtaining a first x-ray image of the device while the device is in a first operation state; obtaining a second x-ray image of the device while the device is in a second operation state different to the first operation state; processing each of the first and the second image, wherein the processing comprises applying a filter obtained based on the noise of the image and a frequency characteristic of the image; superimposing the first and the second images to align a predetermined point in each of the first and the second images; and measuring the displacement of an edge associated with the component between the first and the second image to obtain the displacement of the component within the device during operation of the device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.