Patent · US Active

Handling device for handling a measuring probe

US11022786B2 · kind B2 · utility

0Cited by

8References

20Claims

0Family size

Assignee

Anton Paar GmbH · AT

Inventors

Norbert Pinno-Rath · Graz, AT
Gernot Leuprecht · Graz, AT
Daniel Koller · Graz, AT

Key dates

Filing date	Sep 13, 2018
Grant date	Jun 1, 2021
Priority date	—
Expiry date	Sep 13, 2038

Classification

Technology area (CPC G)Physics
CPC primaryG01Q70/02
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A handling apparatus for handling a measuring probe of a scanning probe microscope is disclosed. The measuring probe has a probe body and a probe tip which is coupled with the probe body by a cantilever. The handling apparatus includes a receiving device for receiving the measuring probe at a receiving area, a guide structure, in which the measuring probe is guidable while at the same time the probe body is at least partially limited and the cantilever and the probe tip are supported without contact, and a transport device for transporting the measuring probe from the receiving area along the guide structure to a target area.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.