Apparatus for sensing electromagnetic radiation incident substantially perpendicular to the surface of a substrate
US11024756B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 14, 2017 |
| Grant date | Jun 1, 2021 |
| Priority date | — |
| Expiry date | Jun 14, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2001/4473
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus comprises a transparent substrate (3), at least one sensor (5) for the detection of electromagnetic radiation (31), and for each sensor a corresponding mirror having a reflective surface (11). The reflective surface (11) is shaped so that electro-magnetic radiation (31) incident on the transparent substrate (3) at a specific angle, passing through the transparent substrate (3) and being reflected by the reflective surface (11) is directed towards the sensor (5). The sensor (5) comprises a two dimensional material like graphene and may be a quantum dot functionalised graphene field effect transistor. The present invention enables the incident electromagnetic radiation (31) to be focussed onto the at least one sensor (5) without the use of additional optical components like lenses or microlenses. This may enable focussed images to be obtained by the apparatus.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.