System and method for in-situ characterization and inspection of additive manufacturing deposits using transient infrared thermography
US11027332B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 14, 2017 |
| Grant date | Jun 8, 2021 |
| Priority date | — |
| Expiry date | Jan 9, 2039 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P10/25
- WIPO fieldMaterials, metallurgy
- WIPO sectorChemistry
Abstract
Systems and methods are provided for the real time inspection of additive manufacturing deposits using infrared thermography. Various embodiments may enable the measurement of material properties and the detection of defects during the additive manufacturing process. Various embodiments may enable the characterization of deposition quality, as well as the detection of deposition defects, such as voids, cracks, disbonds, etc., as a structure is manufactured layer by layer in an additive manufacturing process. Various embodiments may enable quantitative inspection images to be archived and associated with the manufactured structure to document the manufactured structure's structural integrity.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.