Wellsite kerogen maturity determination utilizing raman spectroscopy
US11029250B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 21, 2018 |
| Grant date | Jun 8, 2021 |
| Priority date | — |
| Expiry date | Feb 21, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/2823
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for determining thermal maturity of a formation sample. The method includes: cleaning the formation sample to remove residues of drilling fluid and reservoir fluid to obtain a cleaned sample; performing Raman spectroscopic measurements on the cleaned sample to obtain a Raman spectrum for the cleaned sample; fitting at least a G (graphite) peak and a D1 (defect) peak to the Raman spectrum to obtain Raman shift values for the G peak and the D1 peak and a Raman band separation (RBS) value; using the RBS to generate a vitrinite reflection equivalent (VRe) value using a relationship correlating RBS to VRe; and displaying the VRe as an indicator of formation sample maturity for a depth in the formation from which the cleaned sample was obtained.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.