System, apparatus and method for controlling a processor based on effective stress information
US11029744B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 29, 2017 |
| Grant date | Jun 8, 2021 |
| Priority date | — |
| Expiry date | Jan 27, 2039 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02D10/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In one embodiment, a processor includes: at least one core; a stress detector coupled to the at least one core to receive at least one of a voltage and a temperature at which the processor is to operate, calculate an effective stress based at least in part thereon, and maintain an accumulated effective stress; a clock circuit to calculate a lifetime duration of the processor in a platform; a meter to receive the accumulated effective stress, the lifetime duration and a stress model value and generate a control signal based on a comparison of the accumulated effective stress and the stress model value; and a power controller to control at least one parameter of a turbo mode of the processor based at least in part on the control signal. Other embodiments are described and claimed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.