Modular event-based performance monitoring in integrated circuit development
US11030370B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 30, 2019 |
| Grant date | Jun 8, 2021 |
| Priority date | — |
| Expiry date | Sep 30, 2039 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P90/02
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods to implement performance monitoring of a device under test involve defining one or more sequences. Each of the one or more sequences includes two or more events, each of the two or more events being defined by one or more hardware signals that include a hardware register value, transmission of a message or signal, or a wire voltage change. A method includes initiating a simulation of the device under test by inputting one or more signals at one or more inputs of the device under test for propagation across the device under test, and monitoring completion of the two or more events defining each of the one or more sequences. Performance of the device under test is reported. Reporting includes providing latency of each of the one or more sequences. A final design of the device under test is provided for fabrication based on the performance monitoring.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.