Patent · US Active

Pattern detection

US11030452B2 · kind B2 · utility

1Cited by

1References

26Claims

0Family size

Assignee

Fraunhofer-Gesellschaft zur förderung der angewandten Forschung e.V. · DE

Inventors

Andreas Ernst · Bollschweil, DE
Mathis Hoffmann · Erlangen, DE
Jens-Uwe Garbas · Erlangen, DE
Tobias Bergen · Erlangen, DE

Key dates

Filing date	Mar 7, 2019
Grant date	Jun 8, 2021
Priority date	—
Expiry date	Mar 14, 2039

Classification

Technology area (CPC G)Physics
CPC primaryG06T2207/20036
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method for detecting a known pattern having homogeneous areas includes the steps of taking an image of the known pattern or, of at least a portion of the known pattern, and performing detection. Detection includes an initial detection of a first region of the image and the detection of a feature of the known pattern within a second region of the image. The second region is arranged adjacent to the first region. The initial detection is aimed at estimating at least one region parameter, such as a position of the region of the pattern, and/or orientation of the region or distortion of same. Starting from this, the second region can be selected in which a feature, such as a corner of the checkerboard is detectable. This second detection step is aimed at obtaining at least one region parameter such as the position of a feature within the second region.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.